by jrondon | Jun 3, 2026 | Integrated NanoMaterials Laboratory, Member News, News, Technology Centers
FEATURED NEWS California NanoSystems Institute > Articles by: jrondon UCLA Joins New Southwest Semiconductor Workforce Consortium to Expand Hands-On Microelectronics Training By Nicole Wilkins (Image courtesy: Claudia Valdivieso-Defaz) UCLA is joining a major new...
by jrondon | Aug 22, 2025 | News |
FEATURED NEWS Computer hardware advance solves complex optimization problems Experimental device uses quantum properties for energy-efficient processing at room temperature By Wayne Lewis & Alexander Balandin Figure: (upper panels) Scanning-electron-microscope...
by mroseboro | Jan 31, 2025 | News |
FEATURED NEWS New resource for materials analysis online at UCLA NanoLab Scanning electron microscope enables nanometer-scale imaging and elemental analysis of semiconductors Investigators characterizing the properties of materials such as semiconductors depend on...
by mroseboro | Aug 24, 2020 | News, Research, Technology Centers |
FEATURED NEWS August 24, 2020 | Upgraded cleanroom facilities will give UCLA advanced nanofabrication capabilities Engineering school and California NanoSystems Institute to create integrated, state-of-the-art spaces by Wayne Lewis NanoLab technicians walk down the...
by mroseboro | May 20, 2020 | News |
NanoLab Equipment Equipment Category – Measurement Jeol JSM 6610 – Field Emission Scanning Electron Microscope Location: CNSI Site | Back to Equipment >> Reserve equipment with labrunr A field emission SEM with a semi-in-lens and equipped with a...
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