NanoLabTop-tier technology made available to the UCLA community and beyond. Measurement/Characterization Back to equipment list >> AST GoniometerCNSI Site, Measurement CDE ResMapEngineering Site, Measurement Dektak 6 Surface Profile Measuring SystemEngineering Site, Measurement Veeco Dektak 8 ProfilometerEngineering Site, Measurement EDAX GenesisEngineering Site, Measurement FEI Nova 600 Nanolab DualBeam SEM/FIBEngineering Site, Measurement Hitachi S4700 SEMEngineering Site, Measurement Jeol 7500F – Field Emission Scanning Electron MicroscopeCNSI Site, Measurement M&M probe stationCNSI Site, Engineering Site, Measurement Nanometrics Nanospec 2100 Thin Film Measuring SystemCNSI Site, Engineering Site, Measurement Measurement MicroscopesCNSI Site, Engineering Site, Measurement Prometrix Omnimap RS35CCNSI Site, Measurement SCI Filmtek 2000Engineering Site, Measurement Sopra GES5 EllipsometerEngineering Site, Measurement Tencor Flexus 2320A Stress TesterEngineering Site, Measurement ULVAC UNECS-2000 EllipsometerEngineering Site, Measurement Veeco Dektak 150 Surface ProfilerCNSI Site, Measurement Veeco DiInnova Atomic Force MicroscopeCNSI Site, Measurement VEECO DI 3100 Atomic Force MicroscopeEngineering Site, Measurement Wyko NT3300 Optical ProfilerEngineering Site, Measurement
