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Focused Ion Beam / Scanning Electron Microscope

The Nova 600 is a state-of-the-art nanofabrication tool used for TEM sample preparation, failure analysis applications and providing top-rate SEM imaging. Assisted usage by a skilled Nanolab engineer as well as training for self usage is available for both academic and industry clients.

  • TEM Sample Preparation
  • Cross-Sectional Imaging
  • Nanoscale Patterning
  • Basic Circuit Edits
  • Material Deposition
  • High Resolution SEM Imaging

Contact

Noah Bodzin
310-983-3312
nbodzin@seas.ucla.edu
Engineering V, Room 1129