The JEOL JSM-7500F SEM is an ultrahigh resolution field emission scanning electron microscope featuring enhanced performance, ease of operation, and energy efficiency. It provides in-lens performance and can handle samples up to 150mm in diameter.

The JSM-7500F SEM, with its extreme imaging capabilities, is a superior instrument for use in the fields of nanotechnology, materials science and biology.

Features:

• Source: Cold cathode UHV field emission gun
• Resolution: 1.0nm at 15kV, 1.4nm at 1kV
• Accelerate voltage: 0.1kV to 30kV
• GB mode – provides extreme images at very low accelerating voltage
• Retractable in-lens BEI detector
• 5 axis motor stage control with specimen movement protection