The Innova atomic force microscope from Bruker provides high resolution imaging and a broad range of functionality for application flexibility at a moderate cost – ideal for research use in life sciences, materials, and physical studies.

The proprietary closed-loop scan delivers noise-levels that approach those of high-end, open-loop systems and offers a wide range of functionality for physical, materials, and life sciences, from sub-micron levels up to 90 microns.

Features:

• Exclusive Whisper™ piezo scan technology delivers AFM performance and resolution second only to the Bruker MultiMode.
• Highest resolution optics deliver better data and accurate probe positioning.
• Fast tip exchange and superior sample access offer convenience and exceptional ease of use.
• Full range of SPM modes provides powerful research flexibility.
• Advanced signal access and routing capabilities for custom research.
• Now with Dark Lift™, which leverages Bruker’s patented LiftMode capability, enabling you to distinguish between intrinsic electrical sample properties and photoelectric effects.