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NanoLab Equipment

Equipment Category – Measurement/

Nanometrics Nanospec 210 Thin Film Measuring System

The Nanometrics AFT 210 is an optical-microscope based, computerized, non-contact thickness measurement system that can determine thickness of film. Standard features include a microspectrophotometer head with holographic grating monochromator; low-noise gallium arsenide PMT; linear wavelength and photo-intensity displays; customized microscope with Koehler Illumination; and long life tungsten lamp. The Model 210 also has a variable field diaphragm and turret mounted 5X, 10X, 40X parfocal objective with a .25+/- .1mm diameter measuring aperture. It allows direct operator interface to standard film programs, and 32 user-defined tests, including 2-point calibrations and statistical analysis. 

 

 

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