Location: Engineering IV Site | Back to Equipment >>

Location: CNSI Site | Back to Equipment >>

The Nanometrics AFT 210 is an optical-microscope based, computerized, non-contact thickness measurement system that can determine thickness of film. Standard features include a microspectrophotometer head with holographic grating monochromator; low-noise gallium arsenide PMT; linear wavelength and photo-intensity displays; customized microscope with Koehler Illumination; and long life tungsten lamp. The Model 210 also has a variable field diaphragm and turret mounted 5X, 10X, 40X parfocal objective with a .25+/- .1mm diameter measuring aperture. It allows direct operator interface to standard film programs, and 32 user-defined tests, including 2-point calibrations and statistical analysis.