NanoLab Equipment
Equipment Category – Measurement
Nanometrics Nanospec 210/2100 Thin Film Measuring System
The Nanometrics AFT 210 is an optical-microscope based, computerized, non-contact thickness measurement system that can determine thickness of film. Standard features include a microspectrophotometer head with holographic grating monochromator; low-noise gallium arsenide PMT; linear wavelength and photo-intensity displays; customized microscope with Koehler Illumination; and long life tungsten lamp. The Model 210 also has a variable field diaphragm and turret mounted 5X, 10X, 40X parfocal objective with a .25+/- .1mm diameter measuring aperture. It allows direct operator interface to standard film programs, and 32 user-defined tests, including 2-point calibrations and statistical analysis.
Additional Information
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Staff Contact
- Brian Matthews
- matthews@seas.ucla.edu
- 310.206.5528
- Yuwei Fan
- fan@cnsi.ucla.edu
- 310.983.3257
- Trainings Required: 1