AST Goniometer

AST Goniometer

NanoLab Equipment Equipment Category – Measurement AST Goniometer Location: CNSI Site | Back to Equipment >> Reserve equipment with labrunr Wafer Surface Analysis Systems are specially designed for use in semiconductor wafer processing quality control. The...
CDE ResMap

CDE ResMap

NanoLab Equipment Equipment Category – Measurement CDE ResMap Location: Engineering IV Site | Back to Equipment >> Reserve equipment with LabRunr The CDE ResMap has become an industry standard for cost effective resistivity measurement. Designed to meet...
Dektak 6 Surface Profile Measuring System

Dektak 6 Surface Profile Measuring System

NanoLab Equipment Equipment Category – Measurement Dektak 6 Surface Profile Measuring System Location: Engineering IV Site | Back to Equipment >> Reserve equipment with LabRunr Dektak 6M profilometer measures the surface topography electromechanically by...
Veeco Dektak 8 Profilometer

Veeco Dektak 8 Profilometer

NanoLab Equipment Equipment Category – Measurement/ Veeco Dektak 8 Profilometer Location: Engineering IV Site | Back to Equipment >> Reserve equipment with LabRunr The Dektak 8 is a contact profilometer capable of measuring vertical steps from tens of...
EDAX Genesis

EDAX Genesis

NanoLab Equipment Equipment Category – Measurement/ EDAX Genesis Location: Engineering IV Site | Back to Equipment >> Reserve equipment with LabRunr Note: EDAX is essentially a detector attached to the SEM. In order to be trained on ENAX, you must be a...