Verios SEM

Verios SEM

by | Sep 16, 2025

NanoLab Equipment Equipment Category – Metrology Verios 5 UC – Scanning Electron Microscope Location: CNSI Site | Back to Equipment >> Reserve equipment with labrunr The Verios 5 UC is a state-of-art scanning electron microscope offering...
AST Goniometer

AST Goniometer

by | Jan 31, 2020 | 0 comments

NanoLab Equipment Equipment Category – Measurement AST Goniometer Location: CNSI Site | Back to Equipment >> Reserve equipment with labrunr Wafer Surface Analysis Systems are specially designed for use in semiconductor wafer processing quality control. The...
CDE ResMap

CDE ResMap

by | Jan 31, 2020 | 0 comments

NanoLab Equipment Equipment Category – Measurement CDE ResMap Location: Engineering IV Site | Back to Equipment >> Reserve equipment with LabRunr The CDE ResMap has become an industry standard for cost effective resistivity measurement. Designed to meet...
Dektak 6 Surface Profile Measuring System

Dektak 6 Surface Profile Measuring System

by | Jan 31, 2020 | 0 comments

NanoLab Equipment Equipment Category – Measurement Dektak 6 Surface Profile Measuring System Location: Engineering IV Site | Back to Equipment >> Reserve equipment with LabRunr Dektak 6M profilometer measures the surface topography electromechanically by...
Veeco Dektak 8 Profilometer

Veeco Dektak 8 Profilometer

by | Jan 31, 2020 | 0 comments

NanoLab Equipment Equipment Category – Measurement/ Veeco Dektak 8 Profilometer Location: Engineering IV Site | Back to Equipment >> Reserve equipment with LabRunr The Dektak 8 is a contact profilometer capable of measuring vertical steps from tens of...