by mroseboro | Jan 31, 2020 |
NanoLab Equipment Equipment Category – Measurement AST Goniometer Location: CNSI Site | Back to Equipment >> Reserve equipment with labrunr Wafer Surface Analysis Systems are specially designed for use in semiconductor wafer processing quality control. The...
by kbair | Jan 31, 2020 |
NanoLab Equipment Equipment Category – Measurement CDE ResMap Location: Engineering IV Site | Back to Equipment >> Reserve equipment with LabRunr The CDE ResMap has become an industry standard for cost effective resistivity measurement. Designed to meet...
by kbair | Jan 31, 2020 |
NanoLab Equipment Equipment Category – Measurement Dektak 6 Surface Profile Measuring System Location: Engineering IV Site | Back to Equipment >> Reserve equipment with LabRunr Dektak 6M profilometer measures the surface topography electromechanically by...
by kbair | Jan 31, 2020 |
NanoLab Equipment Equipment Category – Measurement/ Veeco Dektak 8 Profilometer Location: Engineering IV Site | Back to Equipment >> Reserve equipment with LabRunr The Dektak 8 is a contact profilometer capable of measuring vertical steps from tens of...
by kbair | Jan 31, 2020 |
NanoLab Equipment Equipment Category – Measurement/ EDAX Genesis Location: Engineering IV Site | Back to Equipment >> Reserve equipment with LabRunr Note: EDAX is essentially a detector attached to the SEM. In order to be trained on ENAX, you must be a...
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